[CoPt 1.5 ml/ZrO2 xnm]10 multilayer films were deposited on glass substrates by magnetron sputtering and then annealed in vacuum at 600℃ for 30 min. Their structures and magnetic properties were investigated as a function of ZrO2 content. The results show that the grain size and coercivity first increase and then decrease with the increase in ZrO2 content. The maximum coercivity and grain size are obtained at 37 vol.% of ZrO2. The content of ZrO2 in the film plays an important role in the separation of CoPt grains and in the reduction of intergrain exchange interaction. On the basis of the studies of angular dependent coercivity, it is found that the magnetization reversal of CoPt films with （111 ） texture is different from either the domain wall motion or the S-W type of rotation mode.
SHEN Xiaohua XU Xiaohong JIANG Fengxian LV Baohua TIAN Baoqiang JIN Tao
The magnetic properties and structures of [CoPt/Ag]n multilayer films deposited by DC magnetron sputtering have been studied. During the deposited process, two kinds of deposited sequences, that is Ag layer (FDAG) first deposited or CoPt layer (FDCP) first deposited, have been chosen. The results show that the microstructures and coercivities were strongly influenced by the deposited sequence and the thickness of films. The coercivities of [Ag/CoPt]n with FDAG are obviously higher than those of [CoPt/Ag]n with FDCP. Especially, when the thickness of films is 8 nm, the difference of coercivities between the FDAG film and the FDCP film is the largest. It is possibly because Ag plays a role of underlayer in FDAG multilayers, which can induce both the transformation from fcc to fct and the oriented growth along c-axis. In addition, δ M curves reveal that the [CoPt/Ag]8 multilayer film has a lower intergrain interaction than the CoPt/Ag bilayer film.
