The submicron chromium dioxide(CrO2) thin film was fabricated on a poly-crystal titania(TiO2) film using Si wafers as substrates by atmospheric pressure chemical vapor deposition(CVD) method. X-Ray diffraction patterns show that the CrO2 films were pure rutile structure. Scanning electron microscopy(SEM) images indicate that the CrO2 films consisted of submicron grains with a grain size of 250--750 rim. The magnetic researches reveal that the magnetic easy axis is parallel to the films, and at room temperature, the CrO2 films show linear magnetoresistance.
The frequency dependent permittivity for dusty plasmas is provided by introducing the charging response factor and charge relaxation rate of airborne particles. The field equations that describe the characteristics of Terahertz(THz) waves propagation in a dusty plasma sheath are derived and discretized on the basis of the auxiliary differential equation(ADE) in the finite difference time domain(FDTD) method. Compared with numerical solutions in reference, the accuracy for the ADE FDTD method is validated. The reflection property of the metal Aluminum interlayer of the sheath at THz frequencies is discussed. The effects of the thickness, effective collision frequency, airborne particle density, and charge relaxation rate of airborne particles on the electromagnetic properties of Terahertz waves through a dusty plasma slab are investigated.Finally, some potential applications for Terahertz waves in information and communication are analyzed.